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Test Result : (root)

69 failures (+8)
513 tests (±0)
Took 1 hr 34 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec139
 BTS_Tests.TC_data_rtp_tchh485.3 sec139
 BTS_Tests.TC_ho_physical_info3.2 sec287
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec287
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_meas_res_speech_tchh4.7 sec1
 BTS_Tests.TC_meas_res_speech_tchh_facch5.6 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa2565.6 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec287
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec287
 BTS_Tests.TC_pcu_data_ind_lqual_cb5.2 sec27
 BTS_Tests.TC_pcu_ext_rach_content8.4 sec2
 BTS_Tests.TC_pcu_oml_alert4.1 sec287
 BTS_Tests.TC_pcu_rach_content17 sec1
 BTS_Tests.TC_rach_count13 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec287
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec10
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel1.4 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec287
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec129
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec1
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec287
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec287
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec26
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec287
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec26
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec26
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec287
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec287
 BTS_Tests_LAPDm:hopping.TC_t200_n20031 sec287
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec115
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec287
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec287
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec287
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec287
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec287
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec139
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec139
 BTS_Tests:hopping.TC_early_immediate_assignment9.2 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec287
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec287
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec287
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec287
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec287
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec287
 BTS_Tests:hopping.TC_meas_res_speech_tchf4.3 sec24
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch5.9 sec4
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec287
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec287
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec287
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec1
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec287
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec287
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec287
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec287
 BTS_Tests:hopping.TC_rach_count13 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec26
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec287
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35 sec287
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec287
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec26
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec6
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec26
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec26
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec14
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec287
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec31

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min18+50163-5181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec1+104-15
BTS_Tests_LAPDm9 min 27 sec0-1023+123
BTS_Tests_LAPDm:hopping8 min 32 sec1201123
BTS_Tests_OML24 sec101617
BTS_Tests_SMSCB6 min 25 sec002525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping30 min37+30144-3181