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Test Result : (root)

67 failures (+2)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec141
 BTS_Tests.TC_data_rtp_tchh485.3 sec141
 BTS_Tests.TC_ho_physical_info3.3 sec289
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec289
 BTS_Tests.TC_meas_res_sign_tchf21 sec2
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec3
 BTS_Tests.TC_meas_res_speech_tchh11 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa25616 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec289
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec289
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec29
 BTS_Tests.TC_pcu_ext_rach_content24 sec1
 BTS_Tests.TC_pcu_oml_alert4.1 sec289
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec289
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec12
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec289
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec131
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec3
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec289
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec289
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec28
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec2
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec289
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec28
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec28
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec289
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec289
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec289
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec117
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec289
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec289
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec289
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec289
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec289
 BTS_Tests:hopping.TC_data_facch_tchh483.8 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec141
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec141
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec289
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec289
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec289
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec289
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec289
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec289
 BTS_Tests:hopping.TC_meas_res_speech_tchf3.8 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec289
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec289
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec289
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec3
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec289
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec289
 BTS_Tests:hopping.TC_pcu_ext_rach_content24 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec289
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec289
 BTS_Tests:hopping.TC_rll_est_ind24 sec28
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05 sec289
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec289
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec289
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec28
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec8
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec28
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec28
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec3
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec16
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec289
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec33

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min16+10165-1181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 27 sec0-1023+123
BTS_Tests_LAPDm:hopping8 min 49 sec13-1010+123
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping27 sec001414
BTS_Tests:hopping30 min37+30144-3181