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Test Result : (root)

71 failures (-16)
513 tests (±0)
Took 1 hr 33 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec121
 BTS_Tests.TC_data_rtp_tchh485.3 sec121
 BTS_Tests.TC_ho_physical_info3.2 sec296
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec296
 BTS_Tests.TC_meas_res_sign_sdcch848 sec2
 BTS_Tests.TC_meas_res_sign_tchf16 sec1
 BTS_Tests.TC_meas_res_sign_tchh_toa25616 sec1
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec3
 BTS_Tests.TC_meas_res_speech_tchf_facch2.1 sec3
 BTS_Tests.TC_meas_res_speech_tchh_facch2.6 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa2565.6 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec296
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec296
 BTS_Tests.TC_paging_tmsi_200percent28 sec1
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec7
 BTS_Tests.TC_pcu_oml_alert4.2 sec296
 BTS_Tests.TC_pcu_rach_content24 sec1
 BTS_Tests.TC_pcu_rts_req9.1 sec1
 BTS_Tests.TC_rach_count13 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec3
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec296
 BTS_Tests.TC_tx_power_ramp_adm_state_change20 sec2
 BTS_Tests_LAPDm.TC_rec_invalid_frame1 min 11 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec239
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec239
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec6
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment18 sec239
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec239
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error5.7 sec6
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error23 sec3
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame51 sec239
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec6
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec6
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch14 sec239
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec239
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec239
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec97
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec239
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec239
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec239
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec239
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec239
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec121
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec121
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec239
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec239
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec239
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec239
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec239
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec239
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec3
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.3 sec239
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec239
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec239
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec239
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec239
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec239
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec239
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec239
 BTS_Tests:hopping.TC_rll_est_ind24 sec6
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec239
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35 sec239
 BTS_Tests:hopping.TC_rll_rel_req8.4 sec239
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec6
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec6
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec6
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec3
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec239

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min22+60159-6181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0-505+55
BTS_Tests_LAPDm8 min 26 sec1+1022-123
BTS_Tests_LAPDm:hopping8 min 42 sec14-109+123
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 28 sec002525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec0-14014+1414
BTS_Tests:hopping29 min33-30148+3181