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Test Result : (root)

66 failures (+25)
513 tests (+265)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec144
 BTS_Tests.TC_data_rtp_tchh485.3 sec144
 BTS_Tests.TC_ho_physical_info3.2 sec319
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec319
 BTS_Tests.TC_meas_res_sign_tchf2 sec3
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa2565.4 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec319
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec319
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec30
 BTS_Tests.TC_pcu_oml_alert4.1 sec319
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec319
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec10
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec262
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec262
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec29
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec262
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked23 sec262
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec29
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame49 sec262
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss21 sec4
 BTS_Tests_LAPDm:hopping.TC_sabm_contention16 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec29
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec5
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec29
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec262
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec262
 BTS_Tests_LAPDm:hopping.TC_t200_n20030 sec262
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec120
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec262
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec262
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec262
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec262
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec262
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec144
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec144
 BTS_Tests:hopping.TC_encr_cmd_a534.9 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec262
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec262
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec262
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec262
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec262
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec262
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec12
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec5
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec262
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec262
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec262
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec18
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec262
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec262
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec262
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec262
 BTS_Tests:hopping.TC_rach_content_emerg29 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec29
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec262
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35 sec262
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec262
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec29
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec7
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec29
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.1 sec29
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec262
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec18

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min13-10168+1181
BTS_Tests_ASCI28 sec0-505+55
BTS_Tests_ASCI:hopping27 sec005+55+5
BTS_Tests_LAPDm9 min 32 sec0-8023+823
BTS_Tests_LAPDm:hopping9 min 7 sec15+1508+823+23
BTS_Tests_OML24 sec1+1016+1617+17
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec0025+2525+25
BTS_Tests_VAMOS26 sec0-14014+1414
BTS_Tests_VAMOS:hopping26 sec0014+1414+14
BTS_Tests:hopping30 min37+370144+144181+181