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Test Result : (root)

108 failures (-1)
513 tests (±0)
Took 1 hr 33 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_chan_act_a514.3 sec3
 BTS_Tests.TC_chan_act_a524.3 sec3
 BTS_Tests.TC_chan_act_a534.3 sec3
 BTS_Tests.TC_chan_act_a544.3 sec3
 BTS_Tests.TC_data_facch_tchf1441.3 sec2
 BTS_Tests.TC_data_facch_tchh244.9 sec2
 BTS_Tests.TC_data_facch_tchh484.8 sec2
 BTS_Tests.TC_data_rtp_tchf1441.3 sec437
 BTS_Tests.TC_encr_cmd_a514.6 sec3
 BTS_Tests.TC_encr_cmd_a524.6 sec3
 BTS_Tests.TC_encr_cmd_a534.6 sec3
 BTS_Tests.TC_encr_cmd_a544.6 sec3
 BTS_Tests.TC_ho_physical_info3.2 sec736
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec736
 BTS_Tests.TC_ms_pwr_ctrl_constant17 sec707
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec707
 BTS_Tests.TC_pcu_oml_alert4.2 sec736
 BTS_Tests.TC_pcu_rts_req9.2 sec5
 BTS_Tests.TC_rll_est_req_DCCH_33.9 sec3
 BTS_Tests.TC_rll_rel_ind_DCCH_04.5 sec3
 BTS_Tests.TC_rll_rel_ind_DCCH_34.6 sec3
 BTS_Tests.TC_rll_rel_req9 sec3
 BTS_Tests.TC_rll_unit_data_req_DCCH4.3 sec3
 BTS_Tests.TC_rsl_modify_encr7.4 sec3
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec4
 BTS_Tests.TC_tch_sign_l2_fill_frame12 sec3
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec736
 BTS_Tests_LAPDm.TC_establish_ign_first_sabm21 sec3
 BTS_Tests_LAPDm.TC_iframe_seq_and_ack22 sec3
 BTS_Tests_LAPDm.TC_iframe_timer_recovery21 sec3
 BTS_Tests_LAPDm.TC_incorrect_cr24 sec3
 BTS_Tests_LAPDm.TC_normal_reestablishment23 sec3
 BTS_Tests_LAPDm.TC_normal_reestablishment_state_unacked22 sec3
 BTS_Tests_LAPDm.TC_nr_seq_error21 sec3
 BTS_Tests_LAPDm.TC_ns_seq_error23 sec4
 BTS_Tests_LAPDm.TC_rec_invalid_frame37 sec3
 BTS_Tests_LAPDm.TC_rr_response_frame_loss21 sec3
 BTS_Tests_LAPDm.TC_sabm_dm24 sec3
 BTS_Tests_LAPDm.TC_sabm_incorrect_c21 sec3
 BTS_Tests_LAPDm.TC_sabm_invalid_resp26 sec3
 BTS_Tests_LAPDm.TC_sabm_retransmit13 sec3
 BTS_Tests_LAPDm.TC_sabm_retransmit_bts1 min 21 sec3
 BTS_Tests_LAPDm.TC_sabm_ua_dcch_sapi07.1 sec3
 BTS_Tests_LAPDm.TC_segm_concat_dcch22 sec3
 BTS_Tests_LAPDm:hopping.TC_establish_ign_first_sabm21 sec3
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec175
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec175
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec3
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec175
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked22 sec111
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error21 sec3
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error23 sec175
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame37 sec175
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss21 sec175
 BTS_Tests_LAPDm:hopping.TC_sabm_dm24 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec175
 BTS_Tests_LAPDm:hopping.TC_sabm_invalid_resp26 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit13 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit_bts1 min 21 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi07.2 sec3
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec175
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec175
 BTS_Tests_LAPDm:hopping.TC_t200_n20040 sec112
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec175
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec175
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec175
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec175
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec175
 BTS_Tests:hopping.TC_chan_act_a514.3 sec3
 BTS_Tests:hopping.TC_chan_act_a524.4 sec3
 BTS_Tests:hopping.TC_chan_act_a534.3 sec3
 BTS_Tests:hopping.TC_chan_act_a544.3 sec3
 BTS_Tests:hopping.TC_data_facch_tchf1441.3 sec2
 BTS_Tests:hopping.TC_data_facch_tchh244.8 sec2
 BTS_Tests:hopping.TC_data_facch_tchh484.8 sec2
 BTS_Tests:hopping.TC_data_rtp_tchf1441.3 sec175
 BTS_Tests:hopping.TC_deact_sacch40 sec1
 BTS_Tests:hopping.TC_encr_cmd_a514.7 sec3
 BTS_Tests:hopping.TC_encr_cmd_a524.7 sec3
 BTS_Tests:hopping.TC_encr_cmd_a534.6 sec3
 BTS_Tests:hopping.TC_encr_cmd_a544.6 sec3
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec175
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec175
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec175
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec175
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec175
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec175
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec175
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec175
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec175
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec175
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec175
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec2
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec175
 BTS_Tests:hopping.TC_pcu_oml_alert4.4 sec175
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec175
 BTS_Tests:hopping.TC_rll_est_req_DCCH_33.9 sec3
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_09.3 sec175
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec175
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_04.5 sec3
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_34.5 sec3
 BTS_Tests:hopping.TC_rll_rel_req8.9 sec111
 BTS_Tests:hopping.TC_rll_unit_data_req_DCCH4.4 sec3
 BTS_Tests:hopping.TC_rsl_modify_encr7.4 sec3
 BTS_Tests:hopping.TC_rsl_ms_pwr_ctrl1.6 sec7
 BTS_Tests:hopping.TC_sacch_filling23 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame12 sec3
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec175

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min27-30154+3181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm10 min170623
BTS_Tests_LAPDm:hopping10 min190423
BTS_Tests_OML21 sec001717
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping27 min45+20136-2181