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Test Result : (root)

53 failures (+9)
501 tests (±0)
Took 1 hr 34 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchf1441.2 sec362
 BTS_Tests.TC_ho_physical_info3.2 sec912
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec862
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant17 sec639
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec639
 BTS_Tests.TC_paging_tmsi_200percent28 sec1
 BTS_Tests.TC_pcu_oml_alert4.2 sec1600
 BTS_Tests.TC_pcu_rts_req9.2 sec1
 BTS_Tests.TC_pcu_time_ind9 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1600
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec13
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec100
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec100
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment16 sec100
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked12 sec100
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec100
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 1 sec100
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.7 sec100
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec100
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec100
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec100
 BTS_Tests_LAPDm:hopping.TC_t200_n20048 sec100
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec100
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec100
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec100
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec100
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec100
 BTS_Tests:hopping.TC_data_rtp_tchf1441.2 sec100
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec100
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec100
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec100
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec100
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec100
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec100
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.3 sec100
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec100
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec100
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec100
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec100
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec100
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec100
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec100
 BTS_Tests:hopping.TC_pcu_rts_req9.1 sec1
 BTS_Tests:hopping.TC_pcu_time_ind9 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec100
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec100
 BTS_Tests:hopping.TC_rll_rel_req37 sec100
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec100
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec2

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min13+50162-5175
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 25 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML22 sec001717
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min29+40146-4175