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Test Result : (root)

104 failures (+3)
513 tests (+12)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_chan_act_a514.2 sec2
 BTS_Tests.TC_chan_act_a524.3 sec2
 BTS_Tests.TC_chan_act_a534.3 sec2
 BTS_Tests.TC_chan_act_a544.3 sec2
 BTS_Tests.TC_data_facch_tchf1441.2 sec1
 BTS_Tests.TC_data_rtp_tchf1441.2 sec436
 BTS_Tests.TC_data_rtp_tchh245.2 sec6
 BTS_Tests.TC_data_rtp_tchh485.2 sec6
 BTS_Tests.TC_encr_cmd_a514.6 sec2
 BTS_Tests.TC_encr_cmd_a524.6 sec2
 BTS_Tests.TC_encr_cmd_a534.5 sec2
 BTS_Tests.TC_encr_cmd_a544.5 sec2
 BTS_Tests.TC_ho_physical_info3.2 sec986
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec936
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec713
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec713
 BTS_Tests.TC_pcu_oml_alert4.1 sec1674
 BTS_Tests.TC_rll_est_req_DCCH_33.7 sec2
 BTS_Tests.TC_rll_rel_ind_DCCH_04.5 sec2
 BTS_Tests.TC_rll_rel_ind_DCCH_34.4 sec2
 BTS_Tests.TC_rll_rel_req8.9 sec2
 BTS_Tests.TC_rll_unit_data_req_DCCH4.3 sec2
 BTS_Tests.TC_rsl_modify_encr7.3 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame12 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1674
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec4
 BTS_Tests_LAPDm.TC_establish_ign_first_sabm25 sec2
 BTS_Tests_LAPDm.TC_iframe_seq_and_ack27 sec2
 BTS_Tests_LAPDm.TC_iframe_timer_recovery21 sec2
 BTS_Tests_LAPDm.TC_incorrect_cr24 sec2
 BTS_Tests_LAPDm.TC_normal_reestablishment23 sec2
 BTS_Tests_LAPDm.TC_normal_reestablishment_state_unacked22 sec2
 BTS_Tests_LAPDm.TC_nr_seq_error21 sec2
 BTS_Tests_LAPDm.TC_ns_seq_error23 sec2
 BTS_Tests_LAPDm.TC_rec_invalid_frame36 sec2
 BTS_Tests_LAPDm.TC_rr_response_frame_loss21 sec2
 BTS_Tests_LAPDm.TC_sabm_dm28 sec2
 BTS_Tests_LAPDm.TC_sabm_incorrect_c21 sec2
 BTS_Tests_LAPDm.TC_sabm_invalid_resp25 sec2
 BTS_Tests_LAPDm.TC_sabm_retransmit12 sec2
 BTS_Tests_LAPDm.TC_sabm_retransmit_bts1 min 21 sec2
 BTS_Tests_LAPDm.TC_sabm_ua_dcch_sapi07.3 sec2
 BTS_Tests_LAPDm.TC_segm_concat_dcch27 sec2
 BTS_Tests_LAPDm:hopping.TC_establish_ign_first_sabm21 sec2
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec174
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec174
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec2
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment23 sec174
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked22 sec174
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error21 sec2
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error23 sec174
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame36 sec174
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss20 sec174
 BTS_Tests_LAPDm:hopping.TC_sabm_dm24 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec174
 BTS_Tests_LAPDm:hopping.TC_sabm_invalid_resp25 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit13 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit_bts1 min 21 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi07 sec2
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec174
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec174
 BTS_Tests_LAPDm:hopping.TC_t200_n20052 sec174
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec174
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec174
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec174
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec174
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec174
 BTS_Tests:hopping.TC_chan_act_a514.2 sec2
 BTS_Tests:hopping.TC_chan_act_a524.3 sec2
 BTS_Tests:hopping.TC_chan_act_a534.3 sec2
 BTS_Tests:hopping.TC_chan_act_a544.3 sec2
 BTS_Tests:hopping.TC_data_facch_tchf1441.1 sec1
 BTS_Tests:hopping.TC_data_rtp_tchf1441.2 sec174
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec6
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec6
 BTS_Tests:hopping.TC_encr_cmd_a514.6 sec2
 BTS_Tests:hopping.TC_encr_cmd_a524.6 sec2
 BTS_Tests:hopping.TC_encr_cmd_a534.6 sec2
 BTS_Tests:hopping.TC_encr_cmd_a544.5 sec2
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec174
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec174
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.2 sec174
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec174
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec174
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec174
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec174
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec174
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec174
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec174
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec174
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec174
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec174
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec174
 BTS_Tests:hopping.TC_rll_est_req_DCCH_33.7 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec174
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec174
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_04.5 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_34.4 sec2
 BTS_Tests:hopping.TC_rll_rel_req8.7 sec174
 BTS_Tests:hopping.TC_rll_unit_data_req_DCCH4.3 sec2
 BTS_Tests:hopping.TC_rsl_modify_encr7.3 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame12 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec174
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec1

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min26+10155+5181+6
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm10 min170623
BTS_Tests_LAPDm:hopping10 min190423
BTS_Tests_OML20 sec001717
BTS_Tests_SMSCB6 min 23 sec002525
BTS_Tests_SMSCB:hopping6 min 23 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min42+20139+4181+6