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Test Result : (root)

51 failures (-53)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_facch_tchf1441.2 sec4
 BTS_Tests.TC_data_rtp_tchf1441.2 sec439
 BTS_Tests.TC_data_rtp_tchf965.2 sec1
 BTS_Tests.TC_data_rtp_tchh245.2 sec9
 BTS_Tests.TC_data_rtp_tchh485.3 sec9
 BTS_Tests.TC_ho_physical_info3.2 sec989
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec939
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec716
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec716
 BTS_Tests.TC_pcu_oml_alert4.1 sec1677
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec1677
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec7
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec177
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec177
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment25 sec177
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec177
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec177
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame1 min 58 sec177
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.5 sec177
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec177
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch12 sec177
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec177
 BTS_Tests_LAPDm:hopping.TC_t200_n20044 sec177
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec177
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec177
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec177
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec177
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec177
 BTS_Tests:hopping.TC_data_facch_tchf1441.2 sec4
 BTS_Tests:hopping.TC_data_rtp_tchf1441.2 sec177
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec9
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec9
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec177
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec177
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.2 sec177
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec177
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec177
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec177
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec177
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec177
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec177
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec177
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec177
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec177
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec177
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec177
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec177
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec177
 BTS_Tests:hopping.TC_rll_rel_req36 sec177
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2 sec177
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec4

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min12-140169+14181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 23 sec0-17023+1723
BTS_Tests_LAPDm:hopping10 min11-8012+823
BTS_Tests_OML20 sec001717
BTS_Tests_SMSCB6 min 23 sec002525
BTS_Tests_SMSCB:hopping6 min 23 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min28-140153+14181