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Test Result : (root)

48 failures (-1)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec32
 BTS_Tests.TC_data_rtp_tchh485.2 sec32
 BTS_Tests.TC_ho_physical_info3.2 sec1012
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec962
 BTS_Tests.TC_ms_pwr_ctrl_constant20 sec739
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec739
 BTS_Tests.TC_pcu_oml_alert4.1 sec1700
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec1700
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec11
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec200
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery28 sec200
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec200
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec200
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error33 sec200
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame1 min 58 sec200
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.5 sec200
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec200
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch12 sec200
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec200
 BTS_Tests_LAPDm:hopping.TC_t200_n20044 sec200
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec6
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec200
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec200
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec200
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec200
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec200
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec32
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec32
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec200
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec200
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.2 sec200
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec200
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec200
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec200
 BTS_Tests:hopping.TC_meas_res_speech_tchh2 sec200
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec200
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec200
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant20 sec200
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec200
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec200
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec200
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec200
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec200
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec200
 BTS_Tests:hopping.TC_rll_rel_req36 sec200
 BTS_Tests:hopping.TC_sacch_multi_chg49 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2 sec200
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec2

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min9-10172+1181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 24 sec0-1023+123
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 23 sec002525
BTS_Tests_SMSCB:hopping6 min 23 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping31 sec001414
BTS_Tests:hopping29 min27+10154-1181