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Test Result : (root)

89 failures (-15)
513 tests (+265)
Took 1 hr 37 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchf965.7 sec2
 BTS_Tests.TC_data_rtp_tchh245.3 sec118
 BTS_Tests.TC_data_rtp_tchh485.3 sec118
 BTS_Tests.TC_ho_physical_info3.3 sec1098
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1048
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec4
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec825
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec825
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec2
 BTS_Tests.TC_pcu_oml_alert4.1 sec1786
 BTS_Tests.TC_rach_load_count21 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec1786
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec34
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec1
 BTS_Tests_LAPDm.TC_nr_seq_error5 sec2
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec286
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery15 sec286
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec1
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec286
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec286
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error15 sec1
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error15 sec286
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame15 sec286
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec286
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec286
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec1
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch15 sec286
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch15 sec286
 BTS_Tests_LAPDm:hopping.TC_t200_n20015 sec286
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec92
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec1
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec286
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec286
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec286
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec286
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec286
 BTS_Tests:hopping.TC_data_facch_tchh483.7 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec118
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec118
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec286
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec286
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec286
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec286
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec286
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec286
 BTS_Tests:hopping.TC_meas_res_speech_tchf2.4 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec286
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec286
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec286
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec286
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec286
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec286
 BTS_Tests:hopping.TC_pcu_ext_rach_content5.9 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec286
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec286
 BTS_Tests:hopping.TC_pcu_rach_content14 sec1
 BTS_Tests:hopping.TC_rll_est_ind14 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec286
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec286
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec286
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec1
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec1
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec1
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec1
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec286
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec36

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min15-220166+22181
BTS_Tests_ASCI28 sec0-505+55
BTS_Tests_ASCI:hopping1 min 15 sec5+5005+5
BTS_Tests_LAPDm9 min 39 sec1-22022+2223
BTS_Tests_LAPDm:hopping7 min 7 sec15+1508+823+23
BTS_Tests_OML23 sec1+1016+1617+17
BTS_Tests_SMSCB6 min 24 sec0-25025+2525
BTS_Tests_SMSCB:hopping6 min 24 sec0025+2525+25
BTS_Tests_VAMOS26 sec0-14014+1414
BTS_Tests_VAMOS:hopping3 min 30 sec14+140014+14
BTS_Tests:hopping29 min38+380143+143181+181