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Test Result : (root)

90 failures (+36)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec323
 BTS_Tests.TC_data_rtp_tchh485.2 sec323
 BTS_Tests.TC_ho_physical_info3.2 sec1303
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1253
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec3
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests.TC_meas_res_speech_tchf_facch2.1 sec3
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec1030
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec1030
 BTS_Tests.TC_paging_tmsi_200percent28 sec1
 BTS_Tests.TC_pcu_oml_alert4.2 sec1991
 BTS_Tests.TC_pcu_rts_req9.1 sec1
 BTS_Tests.TC_pcu_time_ind9 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec2
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1991
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec491
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec491
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec1
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec491
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec491
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec156
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame1 min 22 sec491
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec156
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec161
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9.3 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit_bts27 sec1
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec491
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch35 sec491
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec491
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec297
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_then_null26 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_schedule20 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec1
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch12 sec491
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec491
 BTS_Tests:hopping.TC_acch_overpower_limit21 sec491
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec491
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx21 sec491
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec323
 BTS_Tests:hopping.TC_data_rtp_tchh485.1 sec118
 BTS_Tests:hopping.TC_encr_cmd_a524.7 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec491
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec491
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec491
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec491
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec491
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec491
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.3 sec491
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec491
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec491
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec156
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma27 sec491
 BTS_Tests:hopping.TC_paging_imsi_200percent_with_ps34 sec1
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec2
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec491
 BTS_Tests:hopping.TC_pcu_data_req_wrong_bts8.9 sec1
 BTS_Tests:hopping.TC_pcu_interf_ind7 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert7.3 sec491
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec491
 BTS_Tests:hopping.TC_pcu_rts_req4.1 sec1
 BTS_Tests:hopping.TC_pcu_socket_reconnect3.3 sec1
 BTS_Tests:hopping.TC_pcu_time_ind9 sec2
 BTS_Tests:hopping.TC_rll_est_ind13 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_09.3 sec491
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec491
 BTS_Tests:hopping.TC_rll_rel_req31 sec491
 BTS_Tests:hopping.TC_rsl_ms_pwr_ctrl1.6 sec2
 BTS_Tests:hopping.TC_speech_rtp_tchf3.5 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd10 sec491

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min16+40165-4181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping1 min 15 sec5+500-55
BTS_Tests_LAPDm9 min 25 sec002323
BTS_Tests_LAPDm:hopping8 min 28 sec14+309-323
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 31 sec2+2023-225
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping3 min 30 sec14+1400-1414
BTS_Tests:hopping28 min38+80143-8181