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Test Result : (root)

56 failures (-161)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec406
 BTS_Tests.TC_data_rtp_tchh485.2 sec406
 BTS_Tests.TC_ho_physical_info3.2 sec581
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec581
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec581
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec581
 BTS_Tests.TC_paging_tmsi_200percent28 sec3
 BTS_Tests.TC_pcu_oml_alert4.2 sec581
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec3
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd1.8 sec581
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec524
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec524
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment16 sec524
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked12 sec524
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec242
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 0 sec524
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec246
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec251
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec524
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec524
 BTS_Tests_LAPDm:hopping.TC_t200_n20040 sec524
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec382
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec524
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec524
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec524
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec524
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec524
 BTS_Tests:hopping.TC_chan_act_a527.9 sec2
 BTS_Tests:hopping.TC_data_rtp_tchh245 sec406
 BTS_Tests:hopping.TC_data_rtp_tchh485.1 sec77
 BTS_Tests:hopping.TC_err_rep_wrong_msg_type10 sec2
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec524
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec524
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec524
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec524
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec524
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec524
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec524
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec524
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec524
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec255
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma33 sec524
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec524
 BTS_Tests:hopping.TC_pcu_ext_rach_content18 sec2
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec524
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec524
 BTS_Tests:hopping.TC_pcu_time_ind8.9 sec6
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec524
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec524
 BTS_Tests:hopping.TC_rll_rel_req36 sec524
 BTS_Tests:hopping.TC_rll_unit_data_req_ACCH5.8 sec2
 BTS_Tests:hopping.TC_si_sched_118 sec2
 BTS_Tests:hopping.TC_si_sched_default9.1 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame5.8 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec524

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min10-30171+3181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0-505+55
BTS_Tests_LAPDm9 min 29 sec002323
BTS_Tests_LAPDm:hopping10 min11-12012+1223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 23 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec0-25025+2525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec0-14014+1414
BTS_Tests:hopping30 min34-1020147+102181