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Test Result : (root)

120 failures (+1)
513 tests (+265)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec152
 BTS_Tests.TC_data_rtp_tchh485.2 sec152
 BTS_Tests.TC_ho_physical_info3.3 sec327
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec327
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec1
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa25611 sec4
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec327
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec327
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec38
 BTS_Tests.TC_pcu_oml_alert4.1 sec327
 BTS_Tests.TC_rsl_chan_initial_ta2 sec4
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec327
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec1
 BTS_Tests_LAPDm.TC_nr_seq_error4.8 sec5
 BTS_Tests_LAPDm:hopping.TC_establish_ign_first_sabm15 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack15 sec270
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery15 sec270
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec37
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec270
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec270
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error15 sec37
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error15 sec5
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame15 sec270
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_contention15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_dm15 sec37
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec5
 BTS_Tests_LAPDm:hopping.TC_sabm_invalid_resp15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit15 sec37
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit_bts15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi015 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi0_nopayload15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi315 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi415 sec1
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch15 sec270
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch15 sec270
 BTS_Tests_LAPDm:hopping.TC_t200_n20015 sec270
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec128
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch4_load_idle17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch4_load_overload17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch8_load_idle17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch8_load_overload17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbch_load_idle_no_cbch15 sec1
 BTS_Tests_SMSCB:hopping.TC_etws_p1ro15 sec1
 BTS_Tests_SMSCB:hopping.TC_etws_p1ro_end15 sec1
 BTS_Tests_SMSCB:hopping.TC_etws_pcu15 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_1block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_2block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_3block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_4block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_and_normal17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_only17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_then_null17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_multi17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_schedule17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_1block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_2block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_3block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_4block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_default_and_normal17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_default_only17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_multi17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_schedule17 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec1
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec270
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec270
 BTS_Tests:hopping.TC_acch_overpower_limit21 sec270
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec270
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec270
 BTS_Tests:hopping.TC_data_facch_tchh243.7 sec1
 BTS_Tests:hopping.TC_data_facch_tchh483.7 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec152
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec152
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec270
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.1 sec270
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec270
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec270
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec270
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec270
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec270
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec270
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec270
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec1
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec270
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec270
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec270
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec270
 BTS_Tests:hopping.TC_rach_content_emerg29 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec37
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05 sec270
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35 sec270
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec270
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec1
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec15
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec37
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec37
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2 sec7
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec9
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2 sec270
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec26

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min14-380167+38181
BTS_Tests_ASCI28 sec0-505+55
BTS_Tests_ASCI:hopping1 min 15 sec5+5005+5
BTS_Tests_LAPDm9 min 30 sec1-22022+2223
BTS_Tests_LAPDm:hopping5 min 45 sec23+230023+23
BTS_Tests_OML23 sec1+1016+1617+17
BTS_Tests_SMSCB6 min 24 sec0-25025+2525
BTS_Tests_SMSCB:hopping6 min 58 sec25+250025+25
BTS_Tests_VAMOS26 sec0-14014+1414
BTS_Tests_VAMOS:hopping3 min 30 sec14+140014+14
BTS_Tests:hopping30 min37+370144+144181+181