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Test Result : (root)

66 failures (-147)
513 tests (+265)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec149
 BTS_Tests.TC_data_rtp_tchh485.3 sec149
 BTS_Tests.TC_ho_physical_info3.3 sec1129
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1079
 BTS_Tests.TC_meas_res_speech_tchh_toa2562.6 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec856
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec856
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec33
 BTS_Tests.TC_pcu_oml_alert4.2 sec1817
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec6
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec1817
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec6
 BTS_Tests_LAPDm.TC_nr_seq_error5 sec2
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec317
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec317
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec32
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment18 sec317
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec317
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error21 sec32
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec317
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec32
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec32
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec317
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec317
 BTS_Tests_LAPDm:hopping.TC_t200_n20046 sec317
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec123
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec317
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec317
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec317
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec317
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec317
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec149
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec149
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec317
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec317
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec317
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec317
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec317
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec317
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec317
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec317
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec317
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec3
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec317
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb4.9 sec317
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec317
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec317
 BTS_Tests:hopping.TC_pcu_rach_content10 sec3
 BTS_Tests:hopping.TC_rach_content_emerg29 sec1
 BTS_Tests:hopping.TC_rach_count13 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec32
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec317
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec317
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec317
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec32
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec23
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec32
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec32
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec317
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec67

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min12-1340169+134181
BTS_Tests_ASCI28 sec0-505+55
BTS_Tests_ASCI:hopping28 sec005+55+5
BTS_Tests_LAPDm9 min 29 sec1-22022+2223
BTS_Tests_LAPDm:hopping8 min 46 sec14+1409+923+23
BTS_Tests_OML24 sec1+1016+1617+17
BTS_Tests_SMSCB6 min 23 sec0-25025+2525
BTS_Tests_SMSCB:hopping6 min 24 sec0025+2525+25
BTS_Tests_VAMOS26 sec0-14014+1414
BTS_Tests_VAMOS:hopping26 sec0014+1414+14
BTS_Tests:hopping29 min38+380143+143181+181