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Test Result : (root)

89 failures (±0)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.9 sec119
 BTS_Tests.TC_data_rtp_tchh485.2 sec119
 BTS_Tests.TC_ho_physical_info3.3 sec1099
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1049
 BTS_Tests.TC_meas_res_sign_sdcch431 sec1
 BTS_Tests.TC_meas_res_sign_tchh_toa25613 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec826
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec826
 BTS_Tests.TC_paging_tmsi_200percent28 sec1
 BTS_Tests.TC_pcu_data_ind_lqual_cb5.2 sec3
 BTS_Tests.TC_pcu_ext_rach_content4.4 sec1
 BTS_Tests.TC_pcu_oml_alert4.1 sec1787
 BTS_Tests.TC_rsl_chan_initial_ta1.9 sec3
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec1787
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec35
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec2
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec287
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery15 sec287
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec2
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec287
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec287
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error15 sec2
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error15 sec287
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame15 sec287
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec287
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec287
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec2
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch15 sec287
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch15 sec287
 BTS_Tests_LAPDm:hopping.TC_t200_n20015 sec287
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec93
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec2
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec287
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec287
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec287
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec287
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec287
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec119
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec119
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec287
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec287
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec287
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec287
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec287
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec287
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.3 sec287
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec287
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec287
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec287
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec287
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec287
 BTS_Tests:hopping.TC_pcu_ext_rach_content13 sec2
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec287
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec287
 BTS_Tests:hopping.TC_pcu_rach_content21 sec2
 BTS_Tests:hopping.TC_rach_load_count20 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec287
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec287
 BTS_Tests:hopping.TC_rll_rel_req8.2 sec287
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec2
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec2
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec2
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec2
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec2
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec287
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec37

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min16+10165-1181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping1 min 15 sec5005
BTS_Tests_LAPDm9 min 33 sec0-1023+123
BTS_Tests_LAPDm:hopping7 min 14 sec150823
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping3 min 30 sec140014
BTS_Tests:hopping29 min380143181