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Test Result : (root)

54 failures (-94)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec28
 BTS_Tests.TC_data_rtp_tchh485.2 sec28
 BTS_Tests.TC_ho_physical_info3.2 sec176
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec176
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec3
 BTS_Tests.TC_ms_pwr_ctrl_constant21 sec176
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec176
 BTS_Tests.TC_paging_tmsi_200percent28 sec2
 BTS_Tests.TC_pcu_oml_alert4.2 sec176
 BTS_Tests.TC_pcu_rts_req9.2 sec1
 BTS_Tests.TC_pcu_time_ind9 sec2
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec176
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec176
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery28 sec18
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment16 sec176
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec176
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error33 sec176
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 1 sec176
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec176
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec176
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec176
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec176
 BTS_Tests_LAPDm:hopping.TC_t200_n20040 sec176
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec4
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec176
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec176
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec176
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec176
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec176
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec28
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec28
 BTS_Tests:hopping.TC_ho_physical_info3.4 sec176
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec176
 BTS_Tests:hopping.TC_meas_res_sign_sdcch87.9 sec176
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec176
 BTS_Tests:hopping.TC_meas_res_sign_tchh2 sec176
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec176
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec176
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec176
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec176
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant20 sec176
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec176
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec176
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec176
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec176
 BTS_Tests:hopping.TC_pcu_rts_req9.2 sec2
 BTS_Tests:hopping.TC_pcu_time_ind9 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec176
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec176
 BTS_Tests:hopping.TC_rll_rel_req36 sec176
 BTS_Tests:hopping.TC_sacch_multi54 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd1.9 sec176
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec1

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min13-250168+25181
BTS_Tests_ASCI27 sec0-505+55
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 24 sec0-23023+2323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML24 sec101617
BTS_Tests_SMSCB6 min 24 sec0-25025+2525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS27 sec0-14014+1414
BTS_Tests_VAMOS:hopping30 sec0-1014+114
BTS_Tests:hopping29 min29-10152+1181