Skip to content
[Jenkins]Jenkins
log insign up

Test Result : (root)

64 failures (-3)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec142
 BTS_Tests.TC_data_rtp_tchh485.3 sec142
 BTS_Tests.TC_ho_physical_info3.3 sec290
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec290
 BTS_Tests.TC_meas_res_sign_tchf20 sec3
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec290
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec290
 BTS_Tests.TC_paging_tmsi_80percent22 sec1
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec30
 BTS_Tests.TC_pcu_oml_alert4.2 sec290
 BTS_Tests.TC_pcu_rach_content5.7 sec1
 BTS_Tests.TC_rsl_chan_initial_ta1.9 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec290
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec13
 BTS_Tests_LAPDm.TC_nr_seq_error4.8 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec290
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec132
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec4
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec290
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec290
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec29
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec3
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec290
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss21 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec29
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec29
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec290
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec290
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec290
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec118
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec290
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec290
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec290
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec290
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec290
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec142
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec142
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec290
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec290
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec290
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec290
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec290
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec290
 BTS_Tests:hopping.TC_meas_res_speech_tchf4.3 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec290
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec290
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec290
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec4
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec290
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec290
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec290
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec290
 BTS_Tests:hopping.TC_rll_est_ind24 sec29
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec290
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec290
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec290
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec29
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec9
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec29
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec29
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec17
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec290
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec34

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min14-20167+2181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 34 sec1+1022-123
BTS_Tests_LAPDm:hopping9 min 17 sec15+208-223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 25 sec002525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping27 sec001414
BTS_Tests:hopping30 min33-40148+4181