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Test Result : (root)

69 failures (+5)
513 tests (±0)
Took 1 hr 33 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec157
 BTS_Tests.TC_data_rtp_tchh485.2 sec157
 BTS_Tests.TC_ho_physical_info3.2 sec1137
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1087
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec1
 BTS_Tests.TC_meas_res_sign_tchh_toa2563 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_meas_res_speech_tchh_facch3 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec864
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec864
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec41
 BTS_Tests.TC_pcu_oml_alert4.1 sec1825
 BTS_Tests.TC_rach_count13 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1825
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec14
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec325
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec325
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec40
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec325
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec325
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec2
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec325
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec40
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec9
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec40
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch14 sec325
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec325
 BTS_Tests_LAPDm:hopping.TC_t200_n20030 sec325
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec131
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec325
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec325
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec325
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec325
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec325
 BTS_Tests:hopping.TC_data_facch_tchh243.6 sec1
 BTS_Tests:hopping.TC_data_facch_tchh483.7 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec157
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec157
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec325
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec325
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec325
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec325
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec325
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec325
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec325
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec325
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec325
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec11
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec325
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec325
 BTS_Tests:hopping.TC_pcu_ext_rach_content12 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec325
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec325
 BTS_Tests:hopping.TC_rll_est_ind24 sec40
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec325
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35 sec325
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec325
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec40
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec31
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec40
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec40
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec2
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec325
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec75

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min17+50164-5181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 31 sec0-1023+123
BTS_Tests_LAPDm:hopping8 min 30 sec14+109-123
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min370144181