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Test Result : (root)

67 failures (±0)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec148
 BTS_Tests.TC_ho_physical_info3.2 sec296
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec296
 BTS_Tests.TC_meas_res_speech_tchf_facch2.9 sec1
 BTS_Tests.TC_meas_res_speech_tchh13 sec2
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec296
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec296
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec36
 BTS_Tests.TC_pcu_oml_alert4.1 sec296
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec296
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec19
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec296
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery22 sec138
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec10
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment25 sec296
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec296
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec35
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec2
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec296
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec35
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec1
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec296
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec296
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec296
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec124
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec296
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec296
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec296
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec296
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec296
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec148
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec148
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec296
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec296
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec296
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec296
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec296
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec296
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch8.7 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec296
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec296
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec296
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec2
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec296
 BTS_Tests:hopping.TC_paging_tmsi_80percent22 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb4.9 sec296
 BTS_Tests:hopping.TC_pcu_oml_alert4 sec296
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec296
 BTS_Tests:hopping.TC_pcu_rach_content18 sec1
 BTS_Tests:hopping.TC_pcu_time_ind9 sec1
 BTS_Tests:hopping.TC_rach_content_emerg29 sec1
 BTS_Tests:hopping.TC_rach_count13 sec1
 BTS_Tests:hopping.TC_rach_load_count21 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec35
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec296
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.5 sec296
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_03.8 sec1
 BTS_Tests:hopping.TC_rll_rel_req6.6 sec296
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec35
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec15
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec35
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec35
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec6
 BTS_Tests:hopping.TC_rsl_modify_encr7.6 sec23
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec296
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec40

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min12-50169+5181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 27 sec0-1023+123
BTS_Tests_LAPDm:hopping8 min 49 sec13+1010-123
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 25 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping30 min41+50140-5181