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Test Result : (root)

65 failures (-4)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec140
 BTS_Tests.TC_data_rtp_tchh485.3 sec140
 BTS_Tests.TC_ho_physical_info3.2 sec288
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec288
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec1
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch2.1 sec2
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec288
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec288
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec28
 BTS_Tests.TC_pcu_oml_alert4.2 sec288
 BTS_Tests.TC_rach_load_count21 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl27 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec288
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec11
 BTS_Tests_LAPDm.TC_nr_seq_error5.1 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec288
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec130
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec2
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec288
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec288
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error5.7 sec27
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame47 sec288
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec27
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec27
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec288
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec288
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec288
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec116
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec288
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec288
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec288
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec288
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec288
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec140
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec140
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec288
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec288
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec288
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec288
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec288
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec288
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch3.9 sec5
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec288
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec288
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec288
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec2
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec288
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec288
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec288
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec288
 BTS_Tests:hopping.TC_rll_est_ind24 sec27
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec288
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_34.9 sec288
 BTS_Tests:hopping.TC_rll_rel_req8.2 sec288
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec27
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec7
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec27
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec27
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec2
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec15
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec288
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec32

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min15-30166+3181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0-105+15
BTS_Tests_LAPDm9 min 34 sec1+1022-123
BTS_Tests_LAPDm:hopping8 min 51 sec14+209-223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping30 min34-30147+3181