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Test Result : (root)

64 failures (+8)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec378
 BTS_Tests.TC_data_rtp_tchh485.2 sec191
 BTS_Tests.TC_ho_physical_info3.2 sec526
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec526
 BTS_Tests.TC_meas_res_sign_sdcch420 sec1
 BTS_Tests.TC_meas_res_sign_tchf32 sec2
 BTS_Tests.TC_meas_res_sign_tchh11 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch7.5 sec3
 BTS_Tests.TC_meas_res_speech_tchh2.9 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa2569.6 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec526
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec526
 BTS_Tests.TC_paging_imsi_200percent17 sec1
 BTS_Tests.TC_paging_imsi_200percent_with_ps34 sec1
 BTS_Tests.TC_paging_tmsi_200percent32 sec1
 BTS_Tests.TC_paging_tmsi_80percent22 sec1
 BTS_Tests.TC_pcu_data_req_agch4.2 sec1
 BTS_Tests.TC_pcu_data_req_wrong_trx4.1 sec1
 BTS_Tests.TC_pcu_oml_alert4.1 sec526
 BTS_Tests.TC_rsl_ms_pwr_ctrl41 sec8
 BTS_Tests.TC_sacch_chan_act_ho_async24 sec1
 BTS_Tests.TC_si_sched_139.1 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd1.8 sec526
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec526
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec368
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment16 sec526
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked12 sec526
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec217
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 1 sec220
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.7 sec121
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec215
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec526
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch49 sec526
 BTS_Tests_LAPDm:hopping.TC_t200_n20040 sec526
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec354
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec526
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec526
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec526
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec526
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec526
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec378
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec378
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec526
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec526
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec526
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec526
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec526
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec526
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec526
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec526
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec526
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant17 sec232
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec526
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec14
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec526
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec526
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec526
 BTS_Tests:hopping.TC_pcu_time_ind9 sec3
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec526
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec526
 BTS_Tests:hopping.TC_rll_rel_req37 sec526
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd1.9 sec526

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min24+100157-10181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 27 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping30 min28-20153+2181