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Test Result : (root)

69 failures (+7)
513 tests (±0)
Took 1 hr 35 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec155
 BTS_Tests.TC_data_rtp_tchh485.2 sec7
 BTS_Tests.TC_ho_physical_info3.2 sec303
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec303
 BTS_Tests.TC_meas_res_sign_tchf2 sec7
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_meas_res_speech_tchh_facch16 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa25610 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec303
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec303
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec43
 BTS_Tests.TC_pcu_oml_alert4.1 sec303
 BTS_Tests.TC_pcu_rach_content19 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec303
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec26
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec303
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec145
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec17
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment18 sec303
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec303
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec42
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec303
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec42
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec8
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec303
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec303
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec303
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec131
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec303
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec303
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec303
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec303
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec303
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec155
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec155
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec303
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.3 sec303
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec303
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec303
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec303
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec303
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec4
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch3 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec303
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec303
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec303
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec9
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec303
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec303
 BTS_Tests:hopping.TC_pcu_oml_alert4 sec303
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec303
 BTS_Tests:hopping.TC_rach_content29 sec3
 BTS_Tests:hopping.TC_rach_content_emerg29 sec1
 BTS_Tests:hopping.TC_rach_count13 sec3
 BTS_Tests:hopping.TC_rll_est_ind24 sec42
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec303
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec303
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec303
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec42
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec2
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec42
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec42
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec13
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec30
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec303
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec47

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min16+40165-4181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 28 sec002323
BTS_Tests_LAPDm:hopping8 min 48 sec14+109-123
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping30 min38+20143-2181