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Test Result : (root)

72 failures (+17)
513 tests (±0)
Took 1 hr 33 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec376
 BTS_Tests.TC_data_rtp_tchh485.3 sec189
 BTS_Tests.TC_dyn_osmo_pdch_act_deact5.1 sec1
 BTS_Tests.TC_ho_physical_info3.2 sec524
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec524
 BTS_Tests.TC_meas_res_sign_sdcch821 sec1
 BTS_Tests.TC_meas_res_sign_tchh4.8 sec1
 BTS_Tests.TC_meas_res_sign_tchh_toa25623 sec1
 BTS_Tests.TC_meas_res_speech_tchf6.6 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch3.9 sec1
 BTS_Tests.TC_meas_res_speech_tchf_sapi33.6 sec1
 BTS_Tests.TC_meas_res_speech_tchh7.8 sec1
 BTS_Tests.TC_meas_res_speech_tchh_facch4.3 sec1
 BTS_Tests.TC_meas_res_speech_tchh_toa25610 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec524
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma33 sec524
 BTS_Tests.TC_paging_imsi_200percent38 sec1
 BTS_Tests.TC_paging_imsi_80percent9.5 sec1
 BTS_Tests.TC_paging_tmsi_200percent10 sec3
 BTS_Tests.TC_paging_tmsi_80percent26 sec1
 BTS_Tests.TC_pcu_ext_rach_content9.6 sec1
 BTS_Tests.TC_pcu_oml_alert4.2 sec524
 BTS_Tests.TC_rll_rel_ind_ACCH_05.1 sec1
 BTS_Tests.TC_rll_rel_ind_ACCH_37.3 sec1
 BTS_Tests.TC_rll_rel_req36 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl21 sec6
 BTS_Tests.TC_rsl_ms_pwr_dyn_ass_updown7.9 sec1
 BTS_Tests.TC_sacch_chan_act_ho_async27 sec1
 BTS_Tests.TC_sacch_multi30 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec524
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec524
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec366
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment26 sec524
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec524
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec215
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 1 sec218
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.7 sec119
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec213
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec524
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch49 sec524
 BTS_Tests_LAPDm:hopping.TC_t200_n20040 sec524
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec352
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec524
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec524
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec524
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec524
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec524
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec376
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec376
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec524
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec524
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec524
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec524
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec524
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec524
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec7
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.3 sec524
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec524
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec524
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec230
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec524
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec12
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec524
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec524
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec524
 BTS_Tests:hopping.TC_pcu_time_ind9 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec524
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec524
 BTS_Tests:hopping.TC_rll_rel_req36 sec524
 BTS_Tests:hopping.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec524

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests29 min31+180150-18181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 27 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping28 min29-10152+1181