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Test Result : (root)

57 failures (-11)
513 tests (±0)
Took 1 hr 34 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec306
 BTS_Tests.TC_data_rtp_tchh485.2 sec306
 BTS_Tests.TC_ho_physical_info3.2 sec481
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec481
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec481
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec481
 BTS_Tests.TC_pcu_oml_alert4.1 sec481
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec4
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec481
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec424
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec424
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment25 sec424
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec424
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec142
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame1 min 47 sec424
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec146
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec151
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec424
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec424
 BTS_Tests_LAPDm:hopping.TC_t200_n20040 sec424
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec282
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec424
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec424
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec424
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec424
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec424
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec306
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec306
 BTS_Tests:hopping.TC_encr_cmd_a547 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec424
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec424
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec424
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec424
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec424
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec424
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec424
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec424
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec424
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant17 sec155
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec424
 BTS_Tests:hopping.TC_pcu_act_req_wrong_bts11 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb8.2 sec424
 BTS_Tests:hopping.TC_pcu_data_req_wrong_ts7.9 sec1
 BTS_Tests:hopping.TC_pcu_ext_rach_content8.2 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec424
 BTS_Tests:hopping.TC_pcu_ptcch10 sec424
 BTS_Tests:hopping.TC_pcu_socket_connect_si3gprs8.2 sec1
 BTS_Tests:hopping.TC_rll_est_ind10 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_032 sec424
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_332 sec424
 BTS_Tests:hopping.TC_rll_rel_req36 sec424
 BTS_Tests:hopping.TC_rsl_ms_pwr_ctrl1.5 sec3
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame7.2 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.2 sec424

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests30 min10-10171+1181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 29 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 27 sec002525
BTS_Tests_SMSCB:hopping6 min 23 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping28 min35-100146+10181