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Test Result : (root)

83 failures (+31)
501 tests (±0)
Took 1 hr 31 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_acch_overpower_rxqual_thresh24 sec1
 BTS_Tests.TC_data_rtp_tchf1440.9 sec121
 BTS_Tests.TC_deact_sacch49 sec1
 BTS_Tests.TC_ho_physical_info3.2 sec121
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec121
 BTS_Tests.TC_meas_res_sign_sdcch842 sec1
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec4
 BTS_Tests.TC_meas_res_sign_tchh_toa2565.8 sec1
 BTS_Tests.TC_meas_res_speech_tchh7.9 sec1
 BTS_Tests.TC_meas_res_speech_tchh_facch15 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec121
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec121
 BTS_Tests.TC_paging_imsi_200percent38 sec1
 BTS_Tests.TC_paging_imsi_80percent22 sec1
 BTS_Tests.TC_paging_tmsi_200percent45 sec1
 BTS_Tests.TC_pcu_data_req_ts_inactive7.5 sec1
 BTS_Tests.TC_pcu_deact_req_wrong_ts5.7 sec1
 BTS_Tests.TC_pcu_oml_alert4.2 sec121
 BTS_Tests.TC_rll_rel_req5.7 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl52 sec1
 BTS_Tests.TC_rsl_ms_pwr_dyn_active214 sec1
 BTS_Tests.TC_rsl_rf_resource_ind7.1 sec1
 BTS_Tests.TC_sacch_multi_chg1 min 24 sec1
 BTS_Tests.TC_speech_no_rtp_tchf16 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame2.8 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.2 sec121
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec1
 BTS_Tests_LAPDm.TC_incorrect_cr32 sec1
 BTS_Tests_LAPDm.TC_normal_reestablishment28 sec1
 BTS_Tests_LAPDm.TC_normal_reestablishment_state_unacked22 sec1
 BTS_Tests_LAPDm.TC_sabm_invalid_resp25 sec1
 BTS_Tests_LAPDm.TC_sabm_retransmit_bts1 min 25 sec2
 BTS_Tests_LAPDm.TC_sabm_ua_dcch_sapi49 sec1
 BTS_Tests_LAPDm.TC_segm_concat_sacch50 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec121
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec121
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment23 sec121
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec121
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec121
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame38 sec121
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec121
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec121
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch9.2 sec121
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch20 sec121
 BTS_Tests_LAPDm:hopping.TC_t200_n20048 sec121
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch9.8 sec121
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec121
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec121
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec121
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec121
 BTS_Tests:hopping.TC_data_rtp_tchf1441.2 sec121
 BTS_Tests:hopping.TC_deact_sacch1 min 37 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec121
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec121
 BTS_Tests:hopping.TC_meas_res_sign_sdcch416 sec1
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.5 sec121
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec121
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.1 sec121
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec121
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec121
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec121
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2561.9 sec121
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec121
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma28 sec121
 BTS_Tests:hopping.TC_paging_imsi_80percent3.9 sec1
 BTS_Tests:hopping.TC_paging_tmsi_200percent32 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec121
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec121
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec121
 BTS_Tests:hopping.TC_pcu_socket_noconnect_nosi3gprs8.2 sec1
 BTS_Tests:hopping.TC_pcu_time_ind9.5 sec1
 BTS_Tests:hopping.TC_rach_content4 sec1
 BTS_Tests:hopping.TC_rll_est_ind10 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec121
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_327 sec121
 BTS_Tests:hopping.TC_rll_rel_req35 sec121
 BTS_Tests:hopping.TC_rsl_ms_pwr_dyn_ass_updown8.2 sec1
 BTS_Tests:hopping.TC_sacch_info_mod29 sec1
 BTS_Tests:hopping.TC_sacch_multi24 sec1
 BTS_Tests:hopping.TC_sacch_multi_chg1 min 23 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame20 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec121
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec1

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests29 min27+170148-17175
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 47 sec7+5016-523
BTS_Tests_LAPDm:hopping8 min 43 sec1101223
BTS_Tests_OML21 sec001717
BTS_Tests_SMSCB6 min 31 sec0-2025+225
BTS_Tests_SMSCB:hopping6 min 20 sec002525
BTS_Tests_VAMOS41 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping28 min38+110137-11175