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Test Result : (root)

73 failures (+20)
513 tests (±0)
Took 1 hr 31 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec326
 BTS_Tests.TC_data_rtp_tchh485.2 sec326
 BTS_Tests.TC_ho_physical_info3.2 sec501
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec501
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec3
 BTS_Tests.TC_ms_pwr_ctrl_constant17 sec501
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec501
 BTS_Tests.TC_paging_tmsi_200percent28 sec5
 BTS_Tests.TC_pcu_oml_alert4.1 sec501
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec501
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec444
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec444
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment26 sec444
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec444
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec162
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 0 sec444
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec166
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec171
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec444
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec444
 BTS_Tests_LAPDm:hopping.TC_t200_n20039 sec444
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec302
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec444
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch21 sec444
 BTS_Tests:hopping.TC_acch_overpower_limit13 sec444
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec444
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec444
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec326
 BTS_Tests:hopping.TC_data_rtp_tchh485.1 sec326
 BTS_Tests:hopping.TC_deact_sacch12 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec444
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec444
 BTS_Tests:hopping.TC_meas_res_sign_sdcch421 sec1
 BTS_Tests:hopping.TC_meas_res_sign_sdcch87.1 sec444
 BTS_Tests:hopping.TC_meas_res_sign_tchf8.5 sec444
 BTS_Tests:hopping.TC_meas_res_sign_tchh6 sec444
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2561.9 sec444
 BTS_Tests:hopping.TC_meas_res_speech_tchf12 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec444
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch6.4 sec444
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec444
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant15 sec175
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec444
 BTS_Tests:hopping.TC_paging_imsi_200percent10 sec1
 BTS_Tests:hopping.TC_paging_imsi_200percent_with_ps39 sec1
 BTS_Tests:hopping.TC_paging_imsi_80percent7.6 sec1
 BTS_Tests:hopping.TC_paging_tmsi_80percent27 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec444
 BTS_Tests:hopping.TC_pcu_oml_alert7.8 sec444
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec444
 BTS_Tests:hopping.TC_pcu_rach_content11 sec1
 BTS_Tests:hopping.TC_pcu_rts_req4 sec1
 BTS_Tests:hopping.TC_rach_count12 sec1
 BTS_Tests:hopping.TC_rll_est_ind24 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec444
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec444
 BTS_Tests:hopping.TC_rll_rel_req12 sec444
 BTS_Tests:hopping.TC_rsl_ms_pwr_ctrl14 sec1
 BTS_Tests:hopping.TC_rsl_ms_pwr_dyn_active214 sec1
 BTS_Tests:hopping.TC_rsl_ms_pwr_dyn_down22 sec1
 BTS_Tests:hopping.TC_rsl_ms_pwr_dyn_up23 sec1
 BTS_Tests:hopping.TC_rsl_rf_resource_ind11 sec1
 BTS_Tests:hopping.TC_sacch_chan_act7.1 sec1
 BTS_Tests:hopping.TC_sacch_chan_act_ho_sync13 sec1
 BTS_Tests:hopping.TC_sacch_multi1 min 0 sec1
 BTS_Tests:hopping.TC_sacch_multi_chg16 sec1
 BTS_Tests:hopping.TC_si_sched_13_2bis_2ter_2quater17 sec1
 BTS_Tests:hopping.TC_si_sched_default9.2 sec1
 BTS_Tests:hopping.TC_speech_no_rtp_tchh19 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame14 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec444
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change20 sec1

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min11-10170+1181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 25 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 26 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping25 min50+210131-21181