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Test Result : (root)

52 failures (-4)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec426
 BTS_Tests.TC_data_rtp_tchh485.2 sec426
 BTS_Tests.TC_ho_physical_info3.2 sec601
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec601
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec601
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec601
 BTS_Tests.TC_paging_tmsi_200percent28 sec2
 BTS_Tests.TC_pcu_oml_alert4 sec601
 BTS_Tests.TC_pcu_socket_connect_si3gprs8.2 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec601
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec544
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec544
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment25 sec544
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec544
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec262
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 0 sec544
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec266
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec271
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec544
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch48 sec544
 BTS_Tests_LAPDm:hopping.TC_t200_n20039 sec544
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd0.69 sec402
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec544
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec544
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec544
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec544
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec544
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec426
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec97
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec544
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec544
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec544
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec544
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec544
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec544
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec5
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec544
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec544
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec544
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant17 sec275
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec544
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec5
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec544
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec544
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec544
 BTS_Tests:hopping.TC_pcu_rts_req9.1 sec1
 BTS_Tests:hopping.TC_pcu_time_ind8.9 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_026 sec544
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_326 sec544
 BTS_Tests:hopping.TC_rll_rel_req36 sec544
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec544

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min10-70171+7181
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping27 sec0055
BTS_Tests_LAPDm9 min 29 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML21 sec101617
BTS_Tests_SMSCB6 min 23 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min30+30151-3181