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Test Result : (root)

65 failures (-55)
513 tests (±0)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec153
 BTS_Tests.TC_data_rtp_tchh485.3 sec153
 BTS_Tests.TC_ho_physical_info3.2 sec328
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec328
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests.TC_meas_res_speech_tchf_facch2.1 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec328
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec328
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec39
 BTS_Tests.TC_pcu_oml_alert4.1 sec328
 BTS_Tests.TC_rach_count13 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec328
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec1
 BTS_Tests_ASCI.TC_vgcs_talker_est_rel1.4 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec271
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec271
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec38
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec271
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec271
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error21 sec38
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame51 sec271
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss21 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_contention16 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec38
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec6
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec38
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch14 sec271
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec271
 BTS_Tests_LAPDm:hopping.TC_t200_n20030 sec271
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd0.7 sec129
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec271
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec271
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec271
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec271
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec271
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec153
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec153
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec271
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec271
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec271
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec271
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec271
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec271
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec2
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec271
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec271
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec271
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec2
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec271
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb4.9 sec271
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec271
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec271
 BTS_Tests:hopping.TC_rll_est_ind24 sec38
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec271
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec271
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_03.4 sec1
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec271
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec2
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec16
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec38
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec38
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec10
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec271
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec27

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min13-10168+1181
BTS_Tests_ASCI28 sec1+104-15
BTS_Tests_ASCI:hopping28 sec0-505+55
BTS_Tests_LAPDm9 min 27 sec0-1023+123
BTS_Tests_LAPDm:hopping8 min 55 sec15-808+823
BTS_Tests_OML21 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 32 sec0-25025+2525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec0-14014+1414
BTS_Tests:hopping30 min35-20146+2181