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Test Result : (root)

62 failures (-5)
513 tests (±0)
Took 1 hr 34 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchf1445.7 sec1
 BTS_Tests.TC_data_rtp_tchh245.2 sec148
 BTS_Tests.TC_data_rtp_tchh485.2 sec148
 BTS_Tests.TC_ho_physical_info3.3 sec323
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec323
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec1
 BTS_Tests.TC_meas_res_speech_tchh_facch11 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec323
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec323
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec34
 BTS_Tests.TC_pcu_oml_alert4.2 sec323
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd1.8 sec323
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec14
 BTS_Tests_LAPDm.TC_nr_seq_error4.8 sec1
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec266
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec266
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec33
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec266
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec266
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error5.7 sec33
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error23 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame51 sec266
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec33
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec33
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch14 sec266
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec266
 BTS_Tests_LAPDm:hopping.TC_t200_n20046 sec266
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec124
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec266
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec266
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec266
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec266
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec266
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec148
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec148
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec266
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec266
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec266
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec266
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec266
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec266
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec3
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec266
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec266
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec266
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec266
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec266
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec266
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec266
 BTS_Tests:hopping.TC_rll_est_ind24 sec33
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec266
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.5 sec266
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec266
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec11
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec33
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec33
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2 sec3
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec5
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec266
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec22

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests31 min14+10167-1181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 37 sec1+1022-123
BTS_Tests_LAPDm:hopping8 min 48 sec140923
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS26 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min32-70149+7181