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Test Result : (root)

61 failures (-6)
513 tests (±0)
Took 1 hr 34 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec138
 BTS_Tests.TC_data_rtp_tchh485.3 sec138
 BTS_Tests.TC_ho_physical_info3.2 sec286
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec286
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec7
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec286
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec286
 BTS_Tests.TC_pcu_data_ind_lqual_cb5.2 sec26
 BTS_Tests.TC_pcu_ext_rach_content3.4 sec1
 BTS_Tests.TC_pcu_oml_alert4.1 sec286
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec286
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec9
 BTS_Tests_LAPDm.TC_nr_seq_error4.9 sec3
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec286
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec128
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment18 sec286
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec286
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error6.7 sec25
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec3
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec286
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec25
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec25
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec286
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec286
 BTS_Tests_LAPDm:hopping.TC_t200_n20031 sec286
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec114
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec286
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec286
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec286
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec286
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec286
 BTS_Tests:hopping.TC_data_rtp_tchf1445.3 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec138
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec138
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec286
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.3 sec286
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec286
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec286
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec286
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec286
 BTS_Tests:hopping.TC_meas_res_speech_tchf2.4 sec23
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.1 sec3
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.3 sec286
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec286
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec286
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec286
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec286
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec286
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec286
 BTS_Tests:hopping.TC_rll_est_ind14 sec25
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec286
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec286
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec286
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec25
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec5
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec25
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec25
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec13
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec286
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec30

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min13-30168+3181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 29 sec102223
BTS_Tests_LAPDm:hopping7 min 55 sec12-2011+223
BTS_Tests_OML23 sec101617
BTS_Tests_SMSCB6 min 25 sec002525
BTS_Tests_SMSCB:hopping6 min 25 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping29 min34-10147+1181