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Test Result : (root)

52 failures (+4)
501 tests (±0)
Took 1 hr 32 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchf1441.3 sec426
 BTS_Tests.TC_ho_physical_info3.2 sec725
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec725
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec696
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec696
 BTS_Tests.TC_pcu_oml_alert4.2 sec725
 BTS_Tests.TC_pcu_rts_req9.2 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec4
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec725
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack29 sec164
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery24 sec164
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment25 sec164
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked29 sec100
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error29 sec164
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame2 min 1 sec164
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss6.6 sec164
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c23 sec164
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch13 sec164
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch49 sec164
 BTS_Tests_LAPDm:hopping.TC_t200_n20048 sec101
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec164
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec164
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec164
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec164
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec164
 BTS_Tests:hopping.TC_data_rtp_tchf1441.2 sec164
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec164
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec164
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec164
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec164
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec164
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec164
 BTS_Tests:hopping.TC_meas_res_speech_tchf_sapi36.6 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec164
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec164
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec164
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec164
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec164
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec164
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec164
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec164
 BTS_Tests:hopping.TC_pcu_rts_req9.1 sec3
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_09.3 sec164
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_39.3 sec164
 BTS_Tests:hopping.TC_rll_rel_req36 sec100
 BTS_Tests:hopping.TC_sacch_multi18 sec1
 BTS_Tests:hopping.TC_sacch_multi_chg1 min 11 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec164
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec1

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests29 min11+10164-1175
BTS_Tests_ASCI27 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 25 sec002323
BTS_Tests_LAPDm:hopping10 min1101223
BTS_Tests_OML22 sec001717
BTS_Tests_SMSCB6 min 24 sec002525
BTS_Tests_SMSCB:hopping6 min 24 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping26 sec001414
BTS_Tests:hopping27 min30+30145-3175