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Test Result : (root)

69 failures (+5)
513 tests (±0)
Took 1 hr 38 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec24
 BTS_Tests.TC_data_rtp_tchh485.3 sec24
 BTS_Tests.TC_ho_physical_info3.3 sec24
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec24
 BTS_Tests.TC_meas_res_speech_tchf1.6 sec1
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec24
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec24
 BTS_Tests.TC_pcu_data_ind_lqual_cb9.6 sec24
 BTS_Tests.TC_pcu_data_req_wrong_trx9.1 sec1
 BTS_Tests.TC_pcu_oml_alert6.2 sec24
 BTS_Tests.TC_rsl_chan_initial_ta2 sec1
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.5 sec3
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd1.7 sec24
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec19
 BTS_Tests_LAPDm.TC_nr_seq_error4.8 sec14
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec24
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec24
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec24
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment17 sec24
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked24 sec24
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec21
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error23 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec24
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss25 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_contention16 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec24
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit8.7 sec1
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch26 sec24
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec24
 BTS_Tests_LAPDm:hopping.TC_t200_n20051 sec24
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.8 sec24
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec24
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec24
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec24
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec24
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec24
 BTS_Tests:hopping.TC_data_facch_tchh243.8 sec2
 BTS_Tests:hopping.TC_data_facch_tchh483.8 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec24
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec24
 BTS_Tests:hopping.TC_encr_cmd_a525 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec24
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.3 sec24
 BTS_Tests:hopping.TC_meas_res_sign_sdcch87.4 sec24
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec24
 BTS_Tests:hopping.TC_meas_res_sign_tchh1.9 sec24
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec24
 BTS_Tests:hopping.TC_meas_res_speech_tchh2 sec24
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec24
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec24
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec3
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec24
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb9.7 sec24
 BTS_Tests:hopping.TC_pcu_data_req_wrong_bts9.3 sec1
 BTS_Tests:hopping.TC_pcu_data_req_wrong_trx9.1 sec2
 BTS_Tests:hopping.TC_pcu_data_req_wrong_ts9.2 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert6.2 sec24
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec24
 BTS_Tests:hopping.TC_rll_est_ind15 sec24
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec24
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.5 sec24
 BTS_Tests:hopping.TC_rll_rel_req8.2 sec24
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec24
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass8.8 sec24
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec24
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec3
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd1.8 sec24
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec7

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min14+10167-1181
BTS_Tests_ASCI28 sec0055
BTS_Tests_ASCI:hopping28 sec0055
BTS_Tests_LAPDm9 min 54 sec102223
BTS_Tests_LAPDm:hopping9 min 24 sec16+507-523
BTS_Tests_OML19 sec101617
BTS_Tests_SMSCB6 min 22 sec002525
BTS_Tests_SMSCB:hopping6 min 22 sec002525
BTS_Tests_VAMOS27 sec001414
BTS_Tests_VAMOS:hopping27 sec001414
BTS_Tests:hopping31 min37-10144+1181