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Test Result : (root)

61 failures (-98)
513 tests (+265)
Took 1 hr 36 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.2 sec160
 BTS_Tests.TC_data_rtp_tchh485.3 sec160
 BTS_Tests.TC_ho_physical_info3.2 sec335
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec335
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec335
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec335
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec46
 BTS_Tests.TC_pcu_ext_rach_content17 sec3
 BTS_Tests.TC_pcu_oml_alert4.1 sec335
 BTS_Tests.TC_rsl_chan_initial_ta2 sec2
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec335
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec8
 BTS_Tests_LAPDm.TC_nr_seq_error5.1 sec2
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec278
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec278
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec45
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec278
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked23 sec278
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec45
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec1
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame53 sec278
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec45
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec5
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec45
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch14 sec278
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec278
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec278
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec136
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec278
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec278
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec278
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec278
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec278
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec160
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec160
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec278
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec278
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec278
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec278
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec278
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec278
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec278
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec278
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec278
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec9
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec278
 BTS_Tests:hopping.TC_paging_tmsi_200percent28 sec1
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec278
 BTS_Tests:hopping.TC_pcu_ext_rach_content8.3 sec1
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec278
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec278
 BTS_Tests:hopping.TC_rll_est_ind24 sec45
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec278
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35 sec278
 BTS_Tests:hopping.TC_rll_rel_req8.2 sec278
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec9
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec45
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec45
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec278
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec34

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests32 min12-800169+80181
BTS_Tests_ASCI27 sec0-505+55
BTS_Tests_ASCI:hopping28 sec005+55+5
BTS_Tests_LAPDm9 min 34 sec1-22022+2223
BTS_Tests_LAPDm:hopping9 min 17 sec14+1409+923+23
BTS_Tests_OML23 sec1+1016+1617+17
BTS_Tests_SMSCB6 min 24 sec0-25025+2525
BTS_Tests_SMSCB:hopping6 min 24 sec0025+2525+25
BTS_Tests_VAMOS26 sec0-14014+1414
BTS_Tests_VAMOS:hopping26 sec0014+1414+14
BTS_Tests:hopping29 min33+330148+148181+181