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Test Result : (root)

60 failures
513 tests
Took 1 hr 39 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_data_rtp_tchh245.3 sec6
 BTS_Tests.TC_data_rtp_tchh485.3 sec6
 BTS_Tests.TC_ho_physical_info3.2 sec6
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec6
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec6
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec6
 BTS_Tests.TC_pcu_data_ind_lqual_cb4.6 sec6
 BTS_Tests.TC_pcu_oml_alert6.2 sec6
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd1.8 sec6
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec1
 BTS_Tests_LAPDm.TC_nr_seq_error4.6 sec3
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec6
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec6
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec6
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment19 sec6
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked24 sec6
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error5.3 sec6
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error23 sec5
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec6
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec6
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit8.6 sec6
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch26 sec6
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec6
 BTS_Tests_LAPDm:hopping.TC_t200_n20039 sec6
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.8 sec6
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec6
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec6
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec6
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec6
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec6
 BTS_Tests:hopping.TC_chan_act_a524.6 sec1
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec6
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec6
 BTS_Tests:hopping.TC_encr_cmd_a543.6 sec1
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec6
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec6
 BTS_Tests:hopping.TC_meas_res_sign_sdcch87.4 sec6
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec6
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec6
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh2 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec6
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec6
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec6
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec6
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb4.5 sec6
 BTS_Tests:hopping.TC_pcu_oml_alert6.1 sec6
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec6
 BTS_Tests:hopping.TC_rll_est_ind24 sec6
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.5 sec6
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.5 sec6
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_03.5 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_33.5 sec1
 BTS_Tests:hopping.TC_rll_rel_req8.2 sec6
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec6
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass8.8 sec6
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec6
 BTS_Tests:hopping.TC_rsl_rf_resource_ind14 sec2
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd1.8 sec6
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec1

All Tests

ClassDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
BTS_Tests34 min10+100171+171181+181
BTS_Tests_ASCI28 sec005+55+5
BTS_Tests_ASCI:hopping28 sec005+55+5
BTS_Tests_LAPDm9 min 58 sec1+1022+2223+23
BTS_Tests_LAPDm:hopping8 min 31 sec13+13010+1023+23
BTS_Tests_OML19 sec1+1016+1617+17
BTS_Tests_SMSCB6 min 25 sec0025+2525+25
BTS_Tests_SMSCB:hopping6 min 26 sec0025+2525+25
BTS_Tests_VAMOS27 sec0014+1414+14
BTS_Tests_VAMOS:hopping27 sec0014+1414+14
BTS_Tests:hopping31 min35+350146+146181+181