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Test Result

71 failures (-46)
513 tests (+265)
Took 2 hr 13 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_rach_count13 sec1
 BTS_Tests.TC_paging_imsi_80percent22 sec1
 BTS_Tests.TC_pcu_rach_content12 sec1
 BTS_Tests:hopping.TC_est_dchan15 sec1
 BTS_Tests:hopping.TC_rach_count13 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests:hopping.TC_pcu_ext_rach_content17 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_33.5 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_contention16 sec1
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec2
 BTS_Tests_ASCI.TC_vgcs_talker_est_rel1.4 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_03.5 sec3
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss21 sec3
 BTS_Tests_LAPDm.TC_nr_seq_error4.7 sec4
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec4
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec7
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec7
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec8
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec12
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec14
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec15
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec18
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.1 sec18
 BTS_Tests:hopping.TC_rll_est_ind24 sec18
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec18
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec18
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec18
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error5.8 sec18
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec18
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec19
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec109
 BTS_Tests.TC_data_rtp_tchh485.2 sec133
 BTS_Tests.TC_data_rtp_tchh245.3 sec133
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec133
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec133
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec251
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec251
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec251
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec251
 BTS_Tests:hopping.TC_meas_res_sign_tchf2 sec251
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec251
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec251
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec251
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec251
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec251
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec251
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec251
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec251
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec251
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec251
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec251
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec251
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec251
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec251
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec251
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec251
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec251
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec251
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec251
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec251
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec251
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec251
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec251
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment24 sec251
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec251
 BTS_Tests.TC_ho_physical_info3.3 sec308
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec308
 BTS_Tests.TC_pcu_oml_alert4.2 sec308
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2 sec308
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec308
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec308

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 35 min71-460442+311513+265