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Test Result

71 failures (+7)
513 tests (±0)
Took 2 hr 12 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests_LAPDm.TC_iframe_seq_and_ack27 sec1
 BTS_Tests_LAPDm.TC_nr_seq_error5.1 sec1
 BTS_Tests:hopping.TC_rach_count13 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf7.2 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch5.8 sec1
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.6 sec1
 BTS_Tests:hopping.TC_paging_imsi_200percent_with_ps33 sec1
 BTS_Tests:hopping.TC_pcu_rach_content9.4 sec1
 BTS_Tests:hopping.TC_pcu_ext_rach_content16 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_33.5 sec1
 BTS_Tests:hopping.TC_data_facch_tchh243.7 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch1.9 sec2
 BTS_Tests.TC_meas_res_speech_tchh_facch7.4 sec2
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec2
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec4
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec6
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec9
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec26
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec35
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec35
 BTS_Tests:hopping.TC_rll_est_ind24 sec35
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec35
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec35
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec35
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec35
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec35
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec36
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec70
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec126
 BTS_Tests.TC_data_rtp_tchh485.2 sec152
 BTS_Tests.TC_data_rtp_tchh245.2 sec152
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec152
 BTS_Tests:hopping.TC_data_rtp_tchh245.2 sec152
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec320
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec320
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec320
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec320
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec320
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec320
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec320
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec320
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.1 sec320
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec320
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.2 sec320
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec320
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec320
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.5 sec320
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec320
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec320
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec320
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec320
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec320
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec320
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec320
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec320
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec320
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery20 sec320
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame40 sec320
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec320
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec320
 BTS_Tests_LAPDm:hopping.TC_t200_n20046 sec320
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment18 sec320
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked23 sec320
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec859
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec859
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1082
 BTS_Tests.TC_ho_physical_info3.2 sec1132
 BTS_Tests.TC_pcu_oml_alert4.1 sec1820
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1820

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 34 min71+70442-7513