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Test Result

85 failures (-4)
513 tests (±0)
Took 2 hr 19 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_pcu_rach_content20 sec1
 BTS_Tests.TC_data_rtp_tchf965.7 sec1
 BTS_Tests_LAPDm.TC_nr_seq_error21 sec1
 BTS_Tests:hopping.TC_rach_count13 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_03.5 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2 sec3
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec3
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec3
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec3
 BTS_Tests:hopping.TC_pcu_rach_content5.5 sec3
 BTS_Tests:hopping.TC_pcu_ext_rach_content18 sec3
 BTS_Tests:hopping.TC_rll_est_ind14 sec3
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec3
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec3
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec3
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec3
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec3
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec3
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec3
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec3
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec3
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec3
 BTS_Tests.TC_rsl_chan_initial_ta2 sec4
 BTS_Tests.TC_pcu_data_ind_lqual_cb4.9 sec4
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec36
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec38
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec94
 BTS_Tests.TC_data_rtp_tchh485.3 sec120
 BTS_Tests.TC_data_rtp_tchh245.2 sec120
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec120
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec120
 BTS_Tests:hopping.TC_ho_physical_info3.3 sec288
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec288
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec288
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec288
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec288
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec288
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec288
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec288
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec288
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec288
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec288
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec288
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec288
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.5 sec288
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec288
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec288
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec288
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec288
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec288
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec288
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec288
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec288
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec288
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec288
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec288
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame51 sec288
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec288
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec288
 BTS_Tests_LAPDm:hopping.TC_t200_n20030 sec288
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec288
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec288
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec288
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec288
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec827
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec827
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec1050
 BTS_Tests.TC_ho_physical_info3.3 sec1100
 BTS_Tests.TC_pcu_oml_alert4.2 sec1788
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1788

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 39 min85-40428+4513