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Test Result

65 failures (+4)
513 tests (±0)
Took 2 hr 14 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests.TC_meas_res_sign_tchf1.9 sec1
 BTS_Tests.TC_rsl_modify_encr4.2 sec1
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec1
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2 sec1
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec1
 BTS_Tests:hopping.TC_paging_imsi_200percent_with_ps34 sec1
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec1
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss21 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec3
 BTS_Tests_LAPDm.TC_nr_seq_error4.8 sec3
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c21 sec6
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec9
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec10
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec10
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec35
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9.1 sec46
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec46
 BTS_Tests:hopping.TC_rll_est_ind24 sec46
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec46
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec46
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec46
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec46
 BTS_Tests.TC_pcu_data_ind_lqual_cb4.9 sec47
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec137
 BTS_Tests.TC_data_rtp_tchh485.2 sec161
 BTS_Tests.TC_data_rtp_tchh245.2 sec161
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec161
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec161
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec279
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.1 sec279
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec279
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec279
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec279
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec279
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec279
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec279
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec279
 BTS_Tests:hopping.TC_pcu_ptcch6 sec279
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5 sec279
 BTS_Tests:hopping.TC_pcu_oml_alert4.1 sec279
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05 sec279
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec279
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec279
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec279
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma32 sec279
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec279
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec279
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec279
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec279
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec279
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec279
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec279
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame51 sec279
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch22 sec279
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec279
 BTS_Tests_LAPDm:hopping.TC_t200_n20047 sec279
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment18 sec279
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked14 sec279
 BTS_Tests.TC_ho_physical_info3.3 sec336
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec336
 BTS_Tests.TC_pcu_oml_alert4.1 sec336
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec336
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec336
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec336

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 36 min65+40448-4513