Skip to content
[Jenkins]Jenkins
log insign up

Test Result

86 failures (+86)
513 tests (+430)
Took 2 hr 18 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_meas_res_sign_tchh6.1 sec1
 BTS_Tests.TC_paging_imsi_80percent22 sec1
 BTS_Tests_LAPDm.TC_nr_seq_error5 sec1
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests:hopping.TC_pcu_ext_rach_content17 sec1
 BTS_Tests:hopping.TC_rach_count13 sec2
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error15 sec2
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec2
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec2
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec2
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec2
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec3
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec3
 BTS_Tests.TC_meas_res_speech_tchf_facch2 sec4
 BTS_Tests.TC_rsl_chan_initial_ta2 sec4
 BTS_Tests:hopping.TC_meas_res_speech_tchf_facch2.9 sec6
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec7
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec8
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec8
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass9 sec17
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec17
 BTS_Tests:hopping.TC_rll_est_ind24 sec17
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH35 sec17
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit9 sec17
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec17
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error15 sec17
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec17
 BTS_Tests.TC_pcu_data_ind_lqual_cb5 sec18
 BTS_Tests:hopping.TC_tx_power_ramp_adm_state_change21 sec52
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.6 sec108
 BTS_Tests.TC_data_rtp_tchh485.2 sec134
 BTS_Tests.TC_data_rtp_tchh245.2 sec134
 BTS_Tests:hopping.TC_data_rtp_tchh485.2 sec134
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec134
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec302
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec302
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec302
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec302
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec302
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.2 sec302
 BTS_Tests:hopping.TC_meas_res_sign_sdcch82.9 sec302
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec302
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec302
 BTS_Tests:hopping.TC_pcu_ptcch6.2 sec302
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb5.1 sec302
 BTS_Tests:hopping.TC_pcu_oml_alert4.2 sec302
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.1 sec302
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.1 sec302
 BTS_Tests:hopping.TC_rll_rel_req8.3 sec302
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd2.1 sec302
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec302
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec302
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec302
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec302
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec302
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec302
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack30 sec302
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery15 sec302
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame15 sec302
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch15 sec302
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch15 sec302
 BTS_Tests_LAPDm:hopping.TC_t200_n20015 sec302
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec302
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec302
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec841
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec841
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1064
 BTS_Tests.TC_ho_physical_info3.3 sec1114
 BTS_Tests.TC_pcu_oml_alert4.1 sec1802
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec1802

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 38 min86+860-1427+345513+430