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Test Result

200 failures (+139)
513 tests (±0)
Took 2 hr 29 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_rsl_ms_pwr_ctrl1.6 sec1
 BTS_Tests:hopping.TC_conn_fail_crit43 sec1
 BTS_Tests:hopping.TC_paging_tmsi_200percent39 sec1
 BTS_Tests:hopping.TC_paging_imsi_200percent_with_ps21 sec1
 BTS_Tests:hopping.TC_pcu_act_req15 sec1
 BTS_Tests:hopping.TC_pcu_act_req_wrong_ts15 sec1
 BTS_Tests:hopping.TC_pcu_act_req_wrong_bts15 sec1
 BTS_Tests:hopping.TC_pcu_act_req_wrong_trx15 sec1
 BTS_Tests:hopping.TC_pcu_deact_req15 sec1
 BTS_Tests:hopping.TC_pcu_deact_req_wrong_ts15 sec1
 BTS_Tests:hopping.TC_pcu_ver_si115 sec1
 BTS_Tests:hopping.TC_pcu_ver_si315 sec1
 BTS_Tests:hopping.TC_pcu_ver_si1315 sec1
 BTS_Tests:hopping.TC_pcu_data_req_pdtch15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_ptcch15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_wrong_bts15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_wrong_trx15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_wrong_ts15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_ts_inactive15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_agch15 sec1
 BTS_Tests:hopping.TC_pcu_data_req_imm_ass_pch18 sec1
 BTS_Tests:hopping.TC_pcu_data_req_imm_ass_agch15 sec1
 BTS_Tests:hopping.TC_pcu_rach_content15 sec1
 BTS_Tests:hopping.TC_pcu_ext_rach_content15 sec1
 BTS_Tests:hopping.TC_pcu_paging_from_rsl15 sec1
 BTS_Tests:hopping.TC_pcu_time_ind15 sec1
 BTS_Tests:hopping.TC_pcu_rts_req15 sec1
 BTS_Tests:hopping.TC_pcu_rr_suspend15 sec1
 BTS_Tests:hopping.TC_pcu_socket_connect_multi15 sec1
 BTS_Tests:hopping.TC_pcu_socket_reconnect20 sec1
 BTS_Tests:hopping.TC_pcu_socket_noconnect_nosi3gprs15 sec1
 BTS_Tests:hopping.TC_pcu_socket_noconnect_nosi4gprs15 sec1
 BTS_Tests:hopping.TC_pcu_socket_connect_si3gprs15 sec1
 BTS_Tests:hopping.TC_pcu_socket_connect_si4gprs15 sec1
 BTS_Tests:hopping.TC_pcu_socket_disconnect_nosi3gprs15 sec1
 BTS_Tests:hopping.TC_pcu_socket_disconnect_nosi4gprs15 sec1
 BTS_Tests:hopping.TC_pcu_socket_verify_info_ind15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_act_deact15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_double_act15 sec1
 BTS_Tests:hopping.TC_dyn_ipa_pdch_act_deact15 sec1
 BTS_Tests:hopping.TC_dyn_ipa_pdch_act_tchf_act_nack15 sec1
 BTS_Tests:hopping.TC_pcu_info_ind_fh_params15 sec1
 BTS_Tests:hopping.TC_pcu_socket_nsvc_ipv415 sec1
 BTS_Tests:hopping.TC_pcu_socket_nsvc_ipv615 sec1
 BTS_Tests:hopping.TC_pcu_socket_two_nsvc15 sec1
 BTS_Tests:hopping.TC_pcu_interf_ind15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_unsol_deact15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_tchf_act15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_tchh_act15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_sdcch8_act15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_tchh_race_act15 sec1
 BTS_Tests:hopping.TC_dyn_osmo_pdch_sdcch8_race_act15 sec1
 BTS_Tests:hopping.TC_dyn_ipa_pdch_tchf_act15 sec1
 BTS_Tests:hopping.TC_dyn_ipa_pdch_tchf_act_pdch_act_nack15 sec1
 BTS_Tests:hopping.TC_rll_est_ind15 sec1
 BTS_Tests:hopping.TC_rll_est_req_ACCH_315 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_315 sec1
 BTS_Tests:hopping.TC_rll_unit_data_req_DCCH15 sec1
 BTS_Tests:hopping.TC_rll_unit_data_req_ACCH15 sec1
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH15 sec1
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH15 sec1
 BTS_Tests:hopping.TC_chan_act_a5115 sec1
 BTS_Tests:hopping.TC_chan_act_a5215 sec1
 BTS_Tests:hopping.TC_chan_act_a5315 sec1
 BTS_Tests:hopping.TC_chan_act_a5415 sec1
 BTS_Tests:hopping.TC_encr_cmd_a5115 sec1
 BTS_Tests:hopping.TC_encr_cmd_a5215 sec1
 BTS_Tests:hopping.TC_encr_cmd_a5315 sec1
 BTS_Tests:hopping.TC_encr_cmd_a5415 sec1
 BTS_Tests:hopping.TC_err_rep_wrong_mdisc15 sec1
 BTS_Tests:hopping.TC_err_rep_wrong_msg_type15 sec1
 BTS_Tests:hopping.TC_err_rep_wrong_sequence15 sec1
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame15 sec1
 BTS_Tests:hopping.TC_speech_no_rtp_tchf15 sec1
 BTS_Tests:hopping.TC_speech_no_rtp_tchh15 sec1
 BTS_Tests:hopping.TC_speech_rtp_tchf15 sec1
 BTS_Tests:hopping.TC_speech_rtp_tchh15 sec1
 BTS_Tests:hopping.TC_speech_osmux_tchf15 sec1
 BTS_Tests:hopping.TC_speech_osmux_tchh15 sec1
 BTS_Tests:hopping.TC_data_rtp_tchf14415 sec1
 BTS_Tests:hopping.TC_data_rtp_tchf9615 sec1
 BTS_Tests:hopping.TC_data_rtp_tchf4815 sec1
 BTS_Tests:hopping.TC_data_rtp_tchf2415 sec1
 BTS_Tests:hopping.TC_data_facch_tchf14415 sec1
 BTS_Tests:hopping.TC_data_facch_tchf9615 sec1
 BTS_Tests:hopping.TC_data_facch_tchf4815 sec1
 BTS_Tests:hopping.TC_data_facch_tchh4815 sec1
 BTS_Tests:hopping.TC_data_facch_tchf2415 sec1
 BTS_Tests:hopping.TC_data_facch_tchh2415 sec1
 BTS_Tests:hopping.TC_early_immediate_assignment15 sec1
 BTS_Tests_SMSCB:hopping.TC_cbch_load_idle_no_cbch15 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_1block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_2block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_3block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_4block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_multi17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_schedule17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_only17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_and_normal17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch4_default_then_null17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch4_load_idle17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch4_load_overload17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_1block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_2block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_3block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_4block17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_multi17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_schedule17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_default_only17 sec1
 BTS_Tests_SMSCB:hopping.TC_sms_cb_cmd_sdcch8_default_and_normal17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch8_load_idle17 sec1
 BTS_Tests_SMSCB:hopping.TC_cbc_sdcch8_load_overload17 sec1
 BTS_Tests_SMSCB:hopping.TC_etws_p1ro15 sec1
 BTS_Tests_SMSCB:hopping.TC_etws_p1ro_end15 sec1
 BTS_Tests_SMSCB:hopping.TC_etws_pcu15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi015 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi0_nopayload15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi315 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_ua_dcch_sapi415 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_contention15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_retransmit_bts15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_invalid_resp15 sec1
 BTS_Tests_LAPDm:hopping.TC_sabm_dm15 sec1
 BTS_Tests_LAPDm:hopping.TC_establish_ign_first_sabm15 sec1
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error15 sec1
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_act_dyn_osmo_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_hvhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_ipa_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vff15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_vhh15 sec1
 BTS_Tests_VAMOS:hopping.TC_vamos_chan_mode_modify_dyn_osmo_hvhh15 sec1
 BTS_Tests_ASCI:hopping.TC_vbs_notification15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_uplink_free_and_busy15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_fail15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_talker_est_rel15 sec1
 BTS_Tests_ASCI:hopping.TC_vgcs_listener_det15 sec1
 BTS_Tests.TC_meas_res_speech_tchf_facch2.1 sec2
 BTS_Tests:hopping.TC_paging_imsi_200percent23 sec2
 BTS_Tests:hopping.TC_pcu_data_req_pch15 sec2
 BTS_Tests:hopping.TC_rll_est_req_DCCH_315 sec2
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_015 sec2
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame15 sec2
 BTS_Tests.TC_meas_res_speech_tchf1.9 sec3
 BTS_Tests.TC_paging_tmsi_200percent28 sec3
 BTS_Tests:hopping.TC_meas_res_speech_tchf1.9 sec6
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error15 sec6
 BTS_Tests:hopping.TC_rsl_ms_pwr_ctrl1.6 sec13
 BTS_Tests:hopping.TC_data_rtp_tchh4815 sec77
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant15 sec246
 BTS_Tests_LAPDm:hopping.TC_rr_response_frame_loss15 sec246
 BTS_Tests_LAPDm:hopping.TC_sabm_incorrect_c15 sec251
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.7 sec387
 BTS_Tests.TC_data_rtp_tchh485.2 sec413
 BTS_Tests.TC_data_rtp_tchh245.2 sec413
 BTS_Tests:hopping.TC_data_rtp_tchh2415 sec413
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec581
 BTS_Tests:hopping.TC_meas_res_speech_tchh2.2 sec581
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.3 sec581
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.3 sec581
 BTS_Tests:hopping.TC_meas_res_sign_tchf2.1 sec581
 BTS_Tests:hopping.TC_meas_res_sign_tchh2.3 sec581
 BTS_Tests:hopping.TC_meas_res_sign_sdcch83.4 sec581
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.3 sec581
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec581
 BTS_Tests:hopping.TC_pcu_ptcch15 sec581
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb15 sec581
 BTS_Tests:hopping.TC_pcu_oml_alert15 sec581
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_015 sec581
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_315 sec581
 BTS_Tests:hopping.TC_rll_rel_req15 sec581
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd15 sec581
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma15 sec581
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh15 sec581
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx15 sec581
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch15 sec581
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch15 sec581
 BTS_Tests:hopping.TC_acch_overpower_limit15 sec581
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack15 sec581
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery15 sec581
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch15 sec581
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch15 sec581
 BTS_Tests_LAPDm:hopping.TC_t200_n20015 sec581
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment15 sec581
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked15 sec581
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec1120
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma32 sec1120
 BTS_Tests.TC_ipa_crcx_ack_addr1.2 sec1343
 BTS_Tests.TC_ho_physical_info3.2 sec1393
 BTS_Tests.TC_pcu_oml_alert4.2 sec2081
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd2.1 sec2081

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 50 min200+1390313-139513