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Test Result

70 failures (+2)
513 tests (±0)
Took 2 hr 17 min.

All Failed Tests

Test NameDurationAge
 BTS_Tests.TC_meas_res_sign_sdcch812 sec1
 BTS_Tests.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests.TC_pcu_data_req_wrong_trx9.1 sec1
 BTS_Tests.TC_pcu_data_req_wrong_ts9.1 sec1
 BTS_Tests.TC_early_immediate_assignment3.5 sec1
 BTS_Tests:hopping.TC_rsl_chan_initial_ta2.1 sec1
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_03.4 sec1
 BTS_Tests:hopping.TC_chan_act_a524.6 sec1
 BTS_Tests:hopping.TC_chan_act_a544.6 sec1
 BTS_Tests:hopping.TC_encr_cmd_a515 sec1
 BTS_Tests:hopping.TC_encr_cmd_a543.6 sec1
 BTS_Tests:hopping.TC_data_rtp_tchf1445.3 sec1
 BTS_Tests:hopping.TC_data_facch_tchh243.8 sec1
 BTS_Tests.TC_meas_res_speech_tchf1.7 sec2
 BTS_Tests:hopping.TC_rsl_modify_encr7.5 sec2
 BTS_Tests_LAPDm:hopping.TC_ns_seq_error16 sec2
 BTS_Tests:hopping.TC_rll_unit_data_ind_DCCH21 sec3
 BTS_Tests_LAPDm.TC_nr_seq_error4.8 sec4
 BTS_Tests:hopping.TC_rll_rel_ind_DCCH_33.5 sec4
 BTS_Tests.TC_tx_power_ramp_adm_state_change21 sec7
 BTS_Tests:hopping.TC_ms_pwr_ctrl_constant16 sec14
 BTS_Tests_LAPDm:hopping.TC_nr_seq_error23 sec32
 BTS_Tests.TC_ho_physical_info3.2 sec35
 BTS_Tests.TC_ipa_crcx_ack_addr1.3 sec35
 BTS_Tests.TC_pcu_data_ind_lqual_cb9.5 sec35
 BTS_Tests.TC_pcu_oml_alert6.3 sec35
 BTS_Tests.TC_tch_sign_l2_fill_frame_dtxd1.7 sec35
 BTS_Tests.TC_ms_pwr_ctrl_constant16 sec35
 BTS_Tests.TC_ms_pwr_ctrl_pf_ewma31 sec35
 BTS_Tests.TC_data_rtp_tchh485.3 sec35
 BTS_Tests.TC_data_rtp_tchh245.3 sec35
 BTS_Tests:hopping.TC_ho_physical_info3.2 sec35
 BTS_Tests:hopping.TC_meas_res_speech_tchh2 sec35
 BTS_Tests:hopping.TC_meas_res_speech_tchh_facch2.2 sec35
 BTS_Tests:hopping.TC_meas_res_speech_tchh_toa2562.2 sec35
 BTS_Tests:hopping.TC_meas_res_sign_tchf10 sec35
 BTS_Tests:hopping.TC_meas_res_sign_tchh1.9 sec35
 BTS_Tests:hopping.TC_meas_res_sign_sdcch87.4 sec35
 BTS_Tests:hopping.TC_meas_res_sign_tchh_toa2562.2 sec35
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_ass8.9 sec35
 BTS_Tests:hopping.TC_rsl_bs_pwr_static_power_control9.2 sec35
 BTS_Tests:hopping.TC_ipa_crcx_ack_addr1.2 sec35
 BTS_Tests:hopping.TC_pcu_ptcch6.1 sec35
 BTS_Tests:hopping.TC_pcu_data_ind_lqual_cb9.7 sec35
 BTS_Tests:hopping.TC_pcu_oml_alert6.2 sec35
 BTS_Tests:hopping.TC_rll_est_ind14 sec35
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_05.6 sec35
 BTS_Tests:hopping.TC_rll_rel_ind_ACCH_35.4 sec35
 BTS_Tests:hopping.TC_rll_rel_req8.2 sec35
 BTS_Tests:hopping.TC_rll_unit_data_ind_ACCH34 sec35
 BTS_Tests:hopping.TC_tch_sign_l2_fill_frame_dtxd1.8 sec35
 BTS_Tests:hopping.TC_ms_pwr_ctrl_pf_ewma31 sec35
 BTS_Tests:hopping.TC_data_rtp_tchh485.3 sec35
 BTS_Tests:hopping.TC_data_rtp_tchh245.3 sec35
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh10 sec35
 BTS_Tests:hopping.TC_acch_overpower_rxqual_thresh_dtx10 sec35
 BTS_Tests:hopping.TC_acch_overpower_always_on_facch10 sec35
 BTS_Tests:hopping.TC_acch_overpower_always_on_sacch10 sec35
 BTS_Tests:hopping.TC_acch_overpower_limit10 sec35
 BTS_Tests_LAPDm:hopping.TC_sabm_dm12 sec35
 BTS_Tests_LAPDm:hopping.TC_iframe_seq_and_ack22 sec35
 BTS_Tests_LAPDm:hopping.TC_iframe_timer_recovery21 sec35
 BTS_Tests_LAPDm:hopping.TC_rec_invalid_frame42 sec35
 BTS_Tests_LAPDm:hopping.TC_segm_concat_dcch26 sec35
 BTS_Tests_LAPDm:hopping.TC_segm_concat_sacch26 sec35
 BTS_Tests_LAPDm:hopping.TC_t200_n20051 sec35
 BTS_Tests_LAPDm:hopping.TC_incorrect_cr24 sec35
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment19 sec35
 BTS_Tests_LAPDm:hopping.TC_normal_reestablishment_state_unacked22 sec35
 BTS_Tests_OML.TC_ipa_osmo_pcu_anr_fwd2.8 sec35

All Tests

PackageDurationFail(diff)Skip(diff)Pass(diff)Total(diff)
(root)1 hr 38 min70+20443-2513